Application of confocal laser scanning microscopy to investigation of micro crystals in transparent amorphous media: photoluminescence tomography and spectroscopy of CdZnSSe crystallites in historical silicate glass

12 April 2024, Version 1
This content is a preprint and has not undergone peer review at the time of posting.

Abstract

Recently, photoluminescence tomography based on the confocal laser scanning microscopy with two-photon excitation has been developed to study the distribution of point and extended defects in the bulk of ZnSe laser crystals. This article presents the use of the tomography to investigate luminescent micro inclusions in transparent amorphous media such as silicate glass. Studies of CdZnSSe crystals synthesized in a silicate glass melt have been carried out using the tomography with both two-photon and single-photon excitation of luminescence. Zn-rich glass manufactured in the 19th century has been found to contain micron-sized crystals of CdZnSSe of hexagonal crystal system exhibiting intense photoluminescence. The photoluminescence band of these crystals has been found to peak at about 2.1 eV (∼ 590 nm) at 300 K. Minor shifts in the maximum of bands and changes in their shape in individual crystals or at tomogram points within the crystal are associated with variations in their composition. Changes in the photoluminescence band shape and maximum due to the excitation of luminescence in CdZnSSe crystallites by laser radiation of different energies have also been observed in this study.

Keywords

semiconductor crystals in glass
laser scanning microscopy
photoluminescence
tomography

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